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The first mid-range VNA provides fast and accurate error vector magnitude measurement

Jun 1 2023 2023-06 Passive Components Keystone Electronics
Article Cover
Keysight Technologies, Inc has released the Keysight E5081A ENA-X, the first midrange VNA producing fast, accurate EVM measurements and speeds up the characterisation of 5G component designs by up to 50%.

     Keysight Technologies E5081A ENA-X, the first mid-range VNA capable of fast and accurate EVM measurement, has been released, and increases the characterization speed of 5G component design by 50%. The need for increasing data speeds and ultra-low latency is driving next-generation wireless communication systems to operate at higher RF.

     To ensure that 5G new radio (NR) transmitters meet these operational requirements, RF engineers must thoroughly test the design and performance of components such as power amplifiers. Obtaining measurements of pa under real conditions can be very time consuming, requiring multiple instruments and test Settings. In addition, obtaining accurate EVM measurements to demonstrate PA compliance with 5G standards requires the use of a high-performance VNA.

     The new device meets this requirement by providing RF engineers with an IF network analyzer platform that integrates modulation distortion analysis, providing full vector correction in the DUT plane in a single test setting. With its unique architecture, the device can perform multiple measurements from a single connection, which simplifies test setup, improves repeatability, and speeds up testing.

     "Combined with the powerful modulation distortion analysis software previously available only on our highest performance PNA family network analyzers, the new IF E5081A ENA-X VNA solution is ideal for 5G transmitter power amplifier characteristics," said Joe Rickert, vice president and general manager of Keysight's Center of Excellence for High Frequency Measurement. "Thanks to a customized mmic, ENA-X provides the highest output power, dynamic range and system stability required by RF engineers without overshadowing the performance of the power amplifier under test."

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